A methodology for introducing atomistic parameter fluctuations into compact device models for circuit simulation

Roy, S. (2003) A methodology for introducing atomistic parameter fluctuations into compact device models for circuit simulation. Journal of Computational Electronics, 2(39540), pp. 427-431.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Professor Scott
Authors: Roy, S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Computational Electronics

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