Aubry, R., Jacquet, J., Weaver, J., Durand, O., Dobson, P., Mills, G., di Forte-Poisson, M., Cassette, S. and Delage, S. (2007) SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices. IEEE Transactions on Electron Devices, 54, pp. 385-390. (doi: 10.1109/TED.2006.890380)
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Weaver, Professor Jonathan and Dobson, Dr Phil |
| Authors: | Aubry, R., Jacquet, J., Weaver, J., Durand, O., Dobson, P., Mills, G., di Forte-Poisson, M., Cassette, S., and Delage, S. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Transactions on Electron Devices |
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