Simulation of enhanced interface trapping due to carrier dynamics in warped valence bands in SiGe devices

Barker, J.R. and Watling, J.R. (2001) Simulation of enhanced interface trapping due to carrier dynamics in warped valence bands in SiGe devices. VLSI Design, 13, pp. 453-458.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Watling, Dr Jeremy
Authors: Barker, J.R., and Watling, J.R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:VLSI Design

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