Barker, J.R. and Watling, J.R. (2001) Simulation of enhanced interface trapping due to carrier dynamics in warped valence bands in SiGe devices. VLSI Design, 13, pp. 453-458.
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy |
Authors: | Barker, J.R., and Watling, J.R. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | VLSI Design |
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