Riddet, C., Brown, A.R., Alexander, C.L., Watling, J.R., Roy, S. and Asenov, A. (2007) 3-D Monte Carlo simulation of the impact of quantum confinement scattering on the magnitude of current fluctuations in double gate MOSFETs. IEEE Transactions on Nanotechnology, 6, pp. 48-55. (doi: 10.1109/TNANO.2006.886739)
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Watling, Dr Jeremy and Roy, Professor Scott |
| Authors: | Riddet, C., Brown, A.R., Alexander, C.L., Watling, J.R., Roy, S., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Transactions on Nanotechnology |
| ISSN: | 1536-125X |
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