Samsudin, K., Adamu-Lerna, F., Brown, A.R., Roy, S. and Asenov, A. (2007) Combined sources of intrinsic parameter fluctuations in sub-25 nm generation UTB-SOI MOSFETs: A statistical simulation study. Solid-State Electronics, 51, pp. 611-616. (doi: 10.1016/j.sse.2007.02.022)
Full text not currently available from Enlighten.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Roy, Professor Scott |
| Authors: | Samsudin, K., Adamu-Lerna, F., Brown, A.R., Roy, S., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Solid-State Electronics |
| ISSN: | 0038-1101 |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details