Goncalves, F.J.T., Paterson, G.W. , McGrouther, D. , Drysdale, T., Togawa, Y., Schmool, D.S. and Stamps, R.L. (2017) Probing microwave fields and enabling in-situ experiments in a transmission electron microscope. Scientific Reports, 7, 11064. (doi: 10.1038/s41598-017-11009-2) (PMID:28894134) (PMCID:PMC5593874)
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Abstract
A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM). We demonstrate the method by measuring the polarisation state of the electromagnetic fields produced by a microstrip waveguide as a function of its gigahertz operating frequency. The forward and backward propagating electromagnetic fields produced by the waveguide, in a specimen-free experiment, exert Lorentz forces on the propagating electron beam. Importantly, in addition to the mapping of dynamic fields, this novel method allows detection of effects of microwave fields on specimens, such as observing ferromagnetic materials at resonance.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McGrouther, Dr Damien and Togawa, Dr Yoshihiko and Paterson, Dr Gary and Stamps, Professor Robert |
Authors: | Goncalves, F.J.T., Paterson, G.W., McGrouther, D., Drysdale, T., Togawa, Y., Schmool, D.S., and Stamps, R.L. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Scientific Reports |
Publisher: | Nature Research |
ISSN: | 2045-2322 |
ISSN (Online): | 2045-2322 |
Copyright Holders: | Copyright © 2017 The Authors |
First Published: | First published in Scientific Reports 7:11064 |
Publisher Policy: | Reproduced under a Creative Commons License |
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