Creating Interface for Local Tests and for Carrying out Local Tests at Telephone User Line and Determining Several Electric Characteristics of Such User Line

National Semiconductor Corporation (1999) Creating Interface for Local Tests and for Carrying out Local Tests at Telephone User Line and Determining Several Electric Characteristics of Such User Line. .

Abstract

The method is carried out by the prodn. of a first and a second voltage (Va,Vb) at a first or a second telephone user line connection (a,b). Measuring these voltages, and distributing a first and a second current (1a,1b) across the first or the second telephone user line connections (a,b). measuring these two currents. Computing a first resistance (Rag) between the first connection (a) and a reference connection as a first function of the measured first and second voltages (Va,Vb) and the measured first and second currents (1a,1b). Computing a second resistance (Rbg) between the second connection (b) and the reference connection as a second function of the measured first and second voltages and currents. Also computing a third resistance (Rab) between the first and second user connections (a,b), as a third function of the measured first and second voltages and currents.

• Item Type: Patents
• Additional Information: Application Number DE1999114858.; ; Publication Nubmer DE19914858; ; Inventor Duncan Bremner.
• Status: Published
• Glasgow Author(s) Enlighten ID: Bremner, Dr Duncan
• Authors: Bremner, D.
• College/School: College of Science and Engineering > School of Engineering