Borici, M., Watling, J., Wilkins, R., Yang, L., Barker, J. and Asenov, A. (2004) Interface roughness scattering and its impact on electron transport in relaxed and strained Si n-MOSFETs. Semiconductor Science and Technology, 19, S155-S157. (doi: 10.1088/0268-1242/19/4/054)
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Borici, M., Watling, J., Wilkins, R., Yang, L., Barker, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Semiconductor Science and Technology |
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