Integrating intrinsic parameter fluctuation description into BSIMSOI to forecast sub-15 nm UTB SOI based 6T SRAM operation

Samsudin, K., Cheng, B., Brown, A.R., Roy, S. and Asenov, A. (2006) Integrating intrinsic parameter fluctuation description into BSIMSOI to forecast sub-15 nm UTB SOI based 6T SRAM operation. Solid-State Electronics, 50, pp. 86-93. (doi: 10.1016/j.sse.2005.10.048)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Roy, Professor Scott
Authors: Samsudin, K., Cheng, B., Brown, A.R., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Solid-State Electronics
ISSN:0038-1101

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