Alexander, C., Brown, A., Watling, J. and Asenov, A. (2005) Impact of single charge trapping in nano-MOSFETs - Electrostatics versus transport effects. IEEE Transactions on Nanotechnology, 4, pp. 339-344. (doi: 10.1109/TNANO.2005.846929)
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Alexander, C., Brown, A., Watling, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | IEEE Transactions on Nanotechnology |
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