Rapid rotation of micron and submicron dielectric particles measured using optical tweezers

Rowe, A.D., Leake, M.C., Morgan, H. and Berry, R.M. (2003) Rapid rotation of micron and submicron dielectric particles measured using optical tweezers. Journal of Modern Optics, 50, pp. 1539-1554. (doi: 10.1080/0950034031000069361)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:UNSPECIFIED
Authors: Rowe, A.D., Leake, M.C., Morgan, H., and Berry, R.M.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Modern Optics

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