Identification and quantification of stress concentrations in ferroelectrics using Kikuchi pattern indexing

MacLaren, I. , Schmitt, L.A., Fuess, H., Kungl, H. and Hoffmann, M.J. (2006) Identification and quantification of stress concentrations in ferroelectrics using Kikuchi pattern indexing. Journal of Physics: Conference Series, 26, pp. 243-246. (doi: 10.1088/1742-6596/26/1/058)

Abstract

Transmission electron microscopy has been used to investigate the junction between two lamellar bands in a tetragonal lead zirconate titanate (PZT) ceramic. It is found that significant bending occurs in the area due to the matching of different domains on <101> planes. Analysis of CBED patterns shows that the orientation relationships between the long boundaries between lamellae is much as expected and allows quantification of local c/a ratios. The short boundaries at the band junction, however, are highly stressed and deviate significantly from ideal misorientation values. This reveals that the areas between the 4- domain junctions in the band junction are highly stressed with peak stresses in the GPa range, which are highly likely to function as the source of microcracks under the additional strains found in device application.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: MacLaren, Dr Ian
• Authors: MacLaren, I., Schmitt, L.A., Fuess, H., Kungl, H., and Hoffmann, M.J.
• College/School: College of Science and Engineering > School of Physics and Astronomy
• Journal Name: Journal of Physics: Conference Series
• Publisher: IOP Publishing
• ISSN: 1742-6588
• ISSN (Online): 1742-6596