Comparative study of InAs quantum dots grown on different GaAs substrates by MOCVD

Liang, S., Zhu, H.L., Pan, J.Q., Hou, L.O. and Wang, W. (2005) Comparative study of InAs quantum dots grown on different GaAs substrates by MOCVD. Journal of Crystal Growth, 282(3-4), pp. 297-304. (doi: 10.1016/j.jcrysgro.2005.05.029)

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Abstract

We present a comparative study of InAs quantum dots grown on Si-doped GaAs (1 0 0) substrates, Si-doped GaAs (1 0 0) vicinal substrates, and semi-insulating GaAs (1 0 0) substrates. The density and size distribution of quantum dots varied greatly with the different substrates used. While dots on exact substrates showed only one dominant size, a clear bimodal size distribution of the InAs quantum dots was observed on GaAs vicinal substrates, which is attributed to the reduced surface diffusion due to the presence of multiatomic steps. The emission wavelength is blueshifted during the growth of GaAs cap layer with a significant narrowing of FWHM. We found that the blueshift is smaller for QDs grown on GaAs (1 0 0) vicinal substrates than that for dots on exact GaAs (1 0 0) substrates. This is attributed to the energy barrier formed at the multiatomic step kinks which prohibits the migration of In adatoms during the early stage of cap layer growth.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Hou, Dr Lianping
Authors: Liang, S., Zhu, H.L., Pan, J.Q., Hou, L.O., and Wang, W.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Crystal Growth
Publisher:Elsevier
ISSN:0022-0248
ISSN (Online):1873-5002
Published Online:30 June 2005

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