The effect of substrate clamping on the paraelectric to antiferroelectric phase transition in Nd-doped BiFeO3 thin films

Zhang, H.R., Kalantari, K., Marincel, D.M., Trolier-McKinstry, S., MacLaren, I. , Ramasse, Q.M., Rainforth, W.M. and Reaney, I.M. (2016) The effect of substrate clamping on the paraelectric to antiferroelectric phase transition in Nd-doped BiFeO3 thin films. Thin Solid Films, 616, pp. 767-772. (doi: 10.1016/j.tsf.2016.10.004)

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Abstract

Thin films were deposited on Pt/Ti/SiO2/Si substrates using pulsed laser deposition from a target with a composition (Bi0.825Nd0.175Fe0.97Ti0.03O3) with 5 mol% excess Bi2O3 within the antiferroelectric (AFE) region of the NdFeO3-BiFeO3 phase diagram. However, Raman spectroscopy and transmission electron microscopy (TEM) revealed that films consisted of a mosaic microstructure in which (AFE), ferroelectric (FE) and paraelectric (PE) phases coexisted. Variation in the spatial distribution of Nd is typically greater in bulk ceramics than in thin films and therefore, the absence of single phase AFE cannot be attributed to local changes in composition. Instead, it is proposed that clamping due to mismatch in thermal expansion coefficient with the substrate suppresses the large volume change associated with the PE-FE and PE-AFE transition in bulk and its absence in the thin film prevents an avalanche-like transition throughout grains, which in bulk sustains single phase AFE, irrespective of local deviations in the Nd concentration.

Item Type:Articles
Additional Information:H.R. Zhang, K·Kalantari, W.M. Rainforth and I.M. Reaney acknowledge the Engineering and Physical Sciences Research Council for funding this work via grant EP/I038934/1, as well as for the support of the U.K. National Facility for Aberration-Corrected STEM facility. D.M. Marincel and S.T. McKinstry acknowledge the financial support from National Science Foundation Grant 1005771, as well as a National Security Science and Engineering Faculty Fellowship.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:MacLaren, Dr Ian
Authors: Zhang, H.R., Kalantari, K., Marincel, D.M., Trolier-McKinstry, S., MacLaren, I., Ramasse, Q.M., Rainforth, W.M., and Reaney, I.M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Thin Solid Films
Publisher:Elsevier
ISSN:0040-6090
Published Online:04 October 2016
Copyright Holders:Copyright © 2016 The Authors
First Published:First published in Thin Solid Films 616: 767-772
Publisher Policy:Reproduced under a Creative Commons License

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