Eblabla, A. M., Li, X. , Wallis, D. J., Guiney, I. and Elgaid, K. (2017) GaN on low resistivity silicon THz high -Q passive device technology. IEEE Transactions on Terahertz Science and Technology, 7(1), pp. 93-97. (doi: 10.1109/TTHZ.2016.2618751)
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Abstract
In this paper, viable transmission media technology has been demonstrated for the first time on GaN on low-resistivity silicon) substrates (ρ < 40 Ω·cm) at H-band frequencies (220–325 GHz). The shielded-elevated coplanar waveguide (CPW) lines employ a standard monolithic microwave integrated circuit compatible air bridge process to elevate the CPW traces above a 5-μm layer of benzocyclobutene on shielded metalized ground plates. An insertion loss of less than 2.3 dB/mm was achieved up to 325 GHz, compared with 27 dB/mm for CPW fabricated directly on the substrate. To prove the efficiency of the technology, a short-circuited stub filter with a resonant frequency of 244 GHz was used. The filter achieved an unloaded Q-factor of 28, along with an insertion loss of 0.35 dB and a return loss of – 34 dB. To our knowledge, these results are the best reported to date for GaN-based technology.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Li, Dr Xu and Elgaid, Dr Khaled |
Authors: | Eblabla, A. M., Li, X., Wallis, D. J., Guiney, I., and Elgaid, K. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | IEEE Transactions on Terahertz Science and Technology |
Publisher: | Institute of Electrical and Electronics Engineers |
ISSN: | 2156-342X |
ISSN (Online): | 2156-3446 |
Published Online: | 28 October 2016 |
Copyright Holders: | Copyright © 2017 IEEE |
First Published: | First published in IEEE Transactions on Terahertz Science and Technology 7(1):93-97 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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