Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

Kim, Y., Nahm, S., Bin Im, W., Jeon, D. and Gregory, D. (2005) Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data. Journal of Luminescence, 115, pp. 1-6. (doi: 10.1016/j.jlumin.2005.02.006)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Gregory, Professor Duncan
Authors: Kim, Y., Nahm, S., Bin Im, W., Jeon, D., and Gregory, D.
College/School:College of Science and Engineering > School of Chemistry
Journal Name:Journal of Luminescence

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