MacKenzie, M., Craven, A., Hamilton, D. and McComb, D. (2006) Electron energy-loss spectrum imaging of high-k dielectric stacks. Applied Physics Letters, 88, (doi: 10.1063/1.2163255)
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McComb, Dr David |
Authors: | MacKenzie, M., Craven, A., Hamilton, D., and McComb, D. |
College/School: | College of Science and Engineering > School of Chemistry |
Journal Name: | Applied Physics Letters |
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