Electron energy-loss spectrum imaging of high-k dielectric stacks

MacKenzie, M., Craven, A., Hamilton, D. and McComb, D. (2006) Electron energy-loss spectrum imaging of high-k dielectric stacks. Applied Physics Letters, 88, (doi: 10.1063/1.2163255)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McComb, Dr David
Authors: MacKenzie, M., Craven, A., Hamilton, D., and McComb, D.
College/School:College of Science and Engineering > School of Chemistry
Journal Name:Applied Physics Letters

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