Al-Afeef, A., Bobynko, J., Cockshott, W. P., Craven, A. J., Zuazo, I., Barges, P. and MacLaren, I. (2016) Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing. Ultramicroscopy, 170, pp. 96-106. (doi: 10.1016/j.ultramic.2016.08.004) (PMID:27566049)
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122396.pdf - Accepted Version 933kB |
Abstract
We have investigated the use of DualEELS in elementally sensitive tilt series tomography in the scanning transmission electron microscope. A procedure is implemented using deconvolution to remove the effects of multiple scattering, followed by normalisation by the zero loss peak intensity. This is performed to produce a signal that is linearly dependent on the projected density of the element in each pixel. This method is compared with one that does not include deconvolution (although normalisation by the zero loss peak intensity is still performed). Additionaly, we compare the 3D reconstruction using a new compressed sensing algorithm, DLET, with the well-established SIRT algorithm. VC precipitates, which are extracted from a steel on a carbon replica, are used in this study. It is found that the use of this linear signal results in a very even density throughout the precipitates. However, when deconvolution is omitted, a slight density reduction is observed in the cores of the precipitates (a so-called cupping artefact). Additionally, it is clearly demonstrated that the 3D morphology is much better reproduced using the DLET algorithm, with very little elongation in the missing wedge direction. It is therefore concluded that reliable elementally sensitive tilt tomography using EELS requires the appropriate use of DualEELS together with a suitable reconstruction algorithm, such as the compressed sensing based reconstruction algorithm used here, to make the best use of the limited data volume and signal to noise inherent in core-loss EELS.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Cockshott, Dr William and Craven, Professor Alan and Al-Afeef, Mr Ala and MacLaren, Dr Ian |
| Authors: | Al-Afeef, A., Bobynko, J., Cockshott, W. P., Craven, A. J., Zuazo, I., Barges, P., and MacLaren, I. |
| College/School: | College of Science and Engineering > School of Computing Science College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Ultramicroscopy |
| Publisher: | Elsevier |
| ISSN: | 0304-3991 |
| ISSN (Online): | 1879-2723 |
| Published Online: | 09 August 2016 |
| Copyright Holders: | Copyright © 2016 Elsevier |
| First Published: | First published in Ultramicroscopy 170:96-106 |
| Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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