Keen, D., Gutmann, M. and Wilson, C. (2006) SXD - the single-crystal diffractometer at the ISIS spallation neutron source. Journal of Applied Crystallography, 39, pp. 714-722. (doi: 10.1107/S0021889806025921)
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Wilson, Professor Charles |
| Authors: | Keen, D., Gutmann, M., and Wilson, C. |
| College/School: | College of Science and Engineering > School of Chemistry |
| Journal Name: | Journal of Applied Crystallography |
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