McVitie, S. and Chapman, J. N. (1997) Reversal mechanisms in lithographically defined magnetic thin film elements imaged by scanning transmission electron microscopy. Microscopy and Microanalysis, 3(2), pp. 146-153.
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Publisher's URL: http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=140839&fulltextType=RA&fileId=S1431927697970124
Abstract
The magnetic behavior of lithographically defined thin film elements of permalloy imaged by Lorentz microscopy is described. Elements of thickness <100 nm, with in-plane dimensions in the micron and sub-micron range and of varying shape, have been subjected to in situ fields using an electron microscope that has been optimized for magnetic imaging. The information provided from the imaging modes has identified the details of the magnetization reversal mechanisms in the elements during the course of a hysteresis cycle. In particular, domain wall clusters which form at the edges of the elements are observed prior to switching of the magnetization. Results are described from elements with near single and multidomain structures with different geometry.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and Chapman, Professor John |
Authors: | McVitie, S., and Chapman, J. N. |
College/School: | College of Science and Engineering College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Microscopy and Microanalysis |
Publisher: | Published for the Microscopy Society of America by Cambridge University Press |
ISSN: | 1431-9276 |
ISSN (Online): | 1435-8115 |
Published Online: | 31 January 2003 |
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