Reversal mechanisms in lithographically defined magnetic thin film elements imaged by scanning transmission electron microscopy

McVitie, S. and Chapman, J. N. (1997) Reversal mechanisms in lithographically defined magnetic thin film elements imaged by scanning transmission electron microscopy. Microscopy and Microanalysis, 3(2), pp. 146-153.

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Abstract

The magnetic behavior of lithographically defined thin film elements of permalloy imaged by Lorentz microscopy is described. Elements of thickness <100 nm, with in-plane dimensions in the micron and sub-micron range and of varying shape, have been subjected to in situ fields using an electron microscope that has been optimized for magnetic imaging. The information provided from the imaging modes has identified the details of the magnetization reversal mechanisms in the elements during the course of a hysteresis cycle. In particular, domain wall clusters which form at the edges of the elements are observed prior to switching of the magnetization. Results are described from elements with near single and multidomain structures with different geometry.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: McVitie, S., and Chapman, J. N.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Microscopy and Microanalysis
Publisher:Published for the Microscopy Society of America by Cambridge University Press
ISSN:1431-9276
ISSN (Online):1435-8115
Published Online:31 January 2003

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