McVitie, S. , Ferrier, R.P. and Nicholson, W.A.P. (1997) Absolute field strength determination of magnetic force microscope tip stray fields. In: Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997. Series: Institute of Physics conference series (153). Institute of Physics Pub.: Bristol ; Philadelphia, pp. 201-204. ISBN 9780750304412
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Abstract
Quantitative analysis of magnetic force microscope (MFM) images is only possible if the magnetic state of the sensing tip is known. In this paper we describe a method which is used to characterise the stray field produced by an MFM tip. The method utilises Lorentz microscopy techniques and tomographic field reconstruction algorithms. A specially constructed calibration specimen enables measurement of the absolute values of the tip stray field to be made.
Item Type: | Book Sections |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen |
Authors: | McVitie, S., Ferrier, R.P., and Nicholson, W.A.P. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Publisher: | Institute of Physics Pub. |
ISSN: | 0951-3248 |
ISBN: | 9780750304412 |
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