Chapman, J.N., McVitie, S. and Hefferman, S.J. (1991) Mapping induction distributions by transmission electron microscopy (invited). Journal of Applied Physics, 69(8), pp. 6078-6083. (doi: 10.1063/1.347775)
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Abstract
The Foucault and differential phase contrast modes of transmission electron microscopy are described and their uses for mapping induction distributions in magnetic thin films compared. The former is simpler to implement but the latter can provide quantitative information to much higher spatial resolution. Examples are given of instances where each is most suitable. Foucault images recorded during in situ magnetizing experiments provide valuable information on the magnetization process in small regular particles while the detailed magnetization distribution close to walls in soft magnetic films is best investigated using modified differential phase contrast microscopy.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and Chapman, Professor John |
| Authors: | Chapman, J.N., McVitie, S., and Hefferman, S.J. |
| College/School: | College of Science and Engineering College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Applied Physics |
| Publisher: | American Institute of Physics |
| ISSN: | 0021-8979 |
| ISSN (Online): | 1089-7550 |
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