te Lintelo, J.G.T., Lodder, J.C., McVitie, S. and Chapman, J.N. (1994) Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy. Journal of Applied Physics, 75(6), pp. 3002-3007. (doi: 10.1063/1.356166)
Full text not currently available from Enlighten.
Abstract
Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and Chapman, Professor John |
| Authors: | te Lintelo, J.G.T., Lodder, J.C., McVitie, S., and Chapman, J.N. |
| College/School: | College of Science and Engineering College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Applied Physics |
| Journal Abbr.: | J. Appl. Phys. |
| Publisher: | American Institute of Physics |
| ISSN: | 0021-8979 |
| ISSN (Online): | 1089-7550 |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details