The Effect of Charge Dissipation Layer Thickness on E-Beam Feature Size for Polycrystalline Diamond

Greer, A. I. M. and Moran, D. A. J. (2012) The Effect of Charge Dissipation Layer Thickness on E-Beam Feature Size for Polycrystalline Diamond. In: SBDD XVII Diamond Workshop, Hasselt, Belgium, March 2012,

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Abstract

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Moran, Professor David and Greer, Mr Andrew
Authors: Greer, A. I. M., and Moran, D. A. J.
College/School:College of Science and Engineering > School of Engineering > Biomedical Engineering
College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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