Analytical simulation of RBS spectra of nanowire samples

Barradas, N. P., Garcia Nunez, C. , Redondo-Cubero, A., Shen, G., Kung, P. and Pau, J.L. (2016) Analytical simulation of RBS spectra of nanowire samples. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 371, pp. 116-120. (doi: 10.1016/j.nimb.2015.08.080)

Full text not currently available from Enlighten.

Abstract

Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5% surface coverage; and 55 nm diameter, 1.1 μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Garcia Nunez, Dr Carlos
Authors: Barradas, N. P., Garcia Nunez, C., Redondo-Cubero, A., Shen, G., Kung, P., and Pau, J.L.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Publisher:Elsevier B.V.
ISSN:0168-583X
ISSN (Online):1872-9584
Published Online:08 September 2015

University Staff: Request a correction | Enlighten Editors: Update this record