Hole transport assisted by the piezoelectric field in In0.4Ga0.6N/GaN quantum wells under electrical injection

Zhang, S., Xie, E., Yan, T., Yang, W., Herrnsdof, J., Gong, Z., Watson, I., Gu, E., Dawson, M. and Hu, X. (2015) Hole transport assisted by the piezoelectric field in In0.4Ga0.6N/GaN quantum wells under electrical injection. Journal of Applied Physics, 118(12), 125709. (doi: 10.1063/1.4931575)

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Abstract

The authors observe the significant penetration of electrically injected holes through InGaN/GaN quantum wells (QWs) with an indium mole fraction of 40%. This effect and its current density dependence were analysed by studies on micro-pixel light-emitting diodes, which allowed current densities to be varied over a wide range up to 5 kA/cm2. The systematic changes in electroluminescence spectra are discussed in the light of the piezoelectric field in the high-indium-content QWs and its screening by the carriers. Simulations were also carried out to clarify the unusual hole transport mechanism and the underlying physics in these high-indium QWs.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Zhang, Dr Shuailong
Authors: Zhang, S., Xie, E., Yan, T., Yang, W., Herrnsdof, J., Gong, Z., Watson, I., Gu, E., Dawson, M., and Hu, X.
Subjects:Q Science > QC Physics
T Technology > T Technology (General)
College/School:College of Science and Engineering > School of Engineering > Biomedical Engineering
Journal Name:Journal of Applied Physics
Publisher:American Institute of Physics
ISSN:0021-8979
ISSN (Online):1089-7550

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