Hierarchical Variability-Aware Compact Models of 20nm Bulk CMOS

Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Lorenz, J. and Asenov, A. (2015) Hierarchical Variability-Aware Compact Models of 20nm Bulk CMOS. In: 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington D.C.,USA, 09-11 Sep 2015, pp. 325-328. ISBN 9781467378598

Abstract

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• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Wang, Dr Xingsheng and Asenov, Professor Asen and Millar, Mr Cameron and Wang, Dr Liping
• Authors: Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Lorenz, J., and Asenov, A.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• ISBN: 9781467378598