Heidari, H. , Mirzakuchaki, S. and Babaie, M. (2008) Reliability Issues of Nanowires in FPNI Technology. In: 16th Iranian Conference on Electrical Engineering (ICEE), Tehran, Iran, 13-15 May, 2008,
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Publisher's URL: http://ieee.org.ir/conference/icee-2008/
Abstract
No abstract available.
| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Heidari, Professor Hadi |
| Authors: | Heidari, H., Mirzakuchaki, S., and Babaie, M. |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Related URLs: |
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