Heidari, H. , Mirzakuchaki, S. and Babaie, M. (2011) Modeling of reliability for programmable nanowires interconnect. International Proceedings of Computer Science and Information Technology, 6, pp. 288-292.
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Publisher's URL: http://www.ipcsit.com/list-30-1.html
Abstract
No abstract available.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Heidari, Professor Hadi |
Authors: | Heidari, H., Mirzakuchaki, S., and Babaie, M. |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | International Proceedings of Computer Science and Information Technology |
Journal Abbr.: | IPCSIT |
Publisher: | IACSIT Press |
ISSN: | 2010-460X |
ISSN (Online): | 2010-460X |
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