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Halpin, J.E., Webster, R.W.H., Gardner, H., Moody, M.P., Bagot, P.A.J. and MacLaren, D.A. (2019) An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam. Ultramicroscopy, 202, pp. 121-127. (doi: 10.1016/j.ultramic.2019.04.005) (PMID:31005819)
Ferluccio, D. A., Halpin, J. E., MacIntosh, K. L., Quinn, R. J., Don, E., Smith, R. I., MacLaren, D. A. and Bos, J.-W. G. (2019) Low thermal conductivity and promising thermoelectric performance in AxCoSb (A = V, Nb or Ta) half-Heuslers with inherent vacancies. Journal of Materials Chemistry C, 7, pp. 6539-6547. (doi: 10.1039/C9TC00743A)
MacLaren, I. , Nord, M., Jiao, C. and YĆ¼celen, E. (2019) Liftout of high-quality thin sections of a perovskite oxide thin film using a xenon plasma focused ion beam microscope. Microscopy and Microanalysis, 25(1), pp. 115-118. (doi: 10.1017/S1431927618016239) (PMID:30696493)