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Millar, D. et al. (2017) Electrical and Chemical Analysis of the In-situ H2 Plasma Cleaned InGaSb-Al2O3 Interface. 48th IEEE Semiconductor Interface Specialists Conference (SISC 2017), San Diego, CA, USA, 6 -9 Dec 2017.

Peralagu, U. (2017) Material for III-V Nanowires. Integration of III-V Nanowire Semiconductors for Next Generation High Performance CMOS SOC Technologies, and Competitive Solutions in European Microwave Week (EuMW 2017), Nuremberg, Germany, 08 Oct 2017.

Hurley, P.K., Monaghan, S., O'Connor, E., Caruso, E., Cherkaoui, K., Floyd, L., Povey, I. M., Millar, D. A. J., Peralagu, U. and Thayne, I. G. (2017) (Invited) The Inversion Behaviour of Narrow Band Gap Mos Systems: Experimental Observations, Physics Based Simulations and Applications. 232nd ECS Meeting, National Harbor, MD, USA, 01-05 Oct 2017.

Thayne, I. , Li, X. , Millar, D., Fu, Y.-C. and Peralagu, U. (2017) Plasma Processing of III-V Materials for Energy Efficient Electronics Applications. In: Advanced Etch Technology for Nanopatterning VI, San Jose, CA, USA, 27 Feb - 01 Mar 2017, 101490R. (doi:10.1117/12.2257863)

Hurley, P. K. et al. (2016) Impedance Spectroscopy of Narrow Band Gap III-V MOS Systems. SINANO-III-V-MOS-Compose3 Workshop, Lausanne, Switzerland, 12 Sep 2016.

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