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Sharp, J., Müller, I. C., Mandal, P., Abbas, A., Nord, M., Doye, A., Ehiasarian, A., Hovsepian, P., MacLaren, I. and Rainforth, W. M. (2019) Characterisation of a high-power impulse magnetron sputtered C/Mo/W wear resistant coating by transmission electron microscopy. Surface and Coatings Technology, 377, 124853. (doi: 10.1016/j.surfcoat.2019.08.007)

Nord, M., Ross, A., McGrouther, D. , Barthel, J., Moreau, M., Hallsteinsen, I., Tybell, T. and MacLaren, I. (2019) Three-dimensional subnanoscale imaging of unit cell doubling due to octahedral tilting and cation modulation in strained perovskite thin films. Physical Review Materials, 3(6), 063605. (doi: 10.1103/PhysRevMaterials.3.063605)

MacLaren, I. , Nord, M., Jiao, C. and Yücelen, E. (2019) Liftout of high-quality thin sections of a perovskite oxide thin film using a xenon plasma focused ion beam microscope. Microscopy and Microanalysis, 25(1), pp. 115-118. (doi: 10.1017/S1431927618016239) (PMID:30696493)

Mir, J.A. et al. (2017) Characterisation of the Medipix3 detector for 60 and 80 keV electrons. Ultramicroscopy, 182, pp. 44-53. (doi: 10.1016/j.ultramic.2017.06.010)

Yang, H. et al. (2017) Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. Ultramicroscopy, 180, pp. 173-179. (doi: 10.1016/j.ultramic.2017.02.006) (PMID:28434783)

Yang, H., Jones, L., Ryll, H., Simson, M., Soltau, H., Kondo, Y., Sagawa, R., Banba, H., MacLaren, I. and Nellist, P. D. (2015) 4D STEM: high efficiency phase contrast imaging using a fast pixelated detector. Journal of Physics: Conference Series, 644, 012032. (doi: 10.1088/1742-6596/644/1/012032)

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