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Craven, A. J., Sala, B., Bobynko, J. and MacLaren, I. (2018) Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards. Ultramicroscopy, 186, pp. 66-81. (doi: 10.1016/j.ultramic.2017.12.011)
Al-Afeef, A., Bobynko, J., Cockshott, W. P., Craven, A. J., Zuazo, I., Barges, P. and MacLaren, I. (2016) Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing. Ultramicroscopy, 170, pp. 96-106. (doi: 10.1016/j.ultramic.2016.08.004) (PMID:27566049)