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Wang, X., Brown, A., Cheng, B. and Asenov, A. (2012) Statistical distribution of RTS amplitudes in 20nm SOI FinFETs. In: Silicon Nanoelectronics Workshop (SNW 2012), Honolulu, HI, USA, 10-11 Jun 2012, (doi: 10.1109/SNW.2012.6243347)

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