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Mendis, B.G., MacKenzie, M. and Craven, A.J. (2010) A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), pp. 105-117. (doi: 10.1016/j.ultramic.2009.09.013)

MacLaren, I., Ras, T., MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2009) Texture, twinning and metastable "tetragonal" phase in ultrathin films of HfO2 on a Si substrate. Journal of the Electrochemical Society, 156(8), G103-G108. (doi: 10.1149/1.3141705)

Scott, J. , Thomas, P.J., MacKenzie, M., McFadzean, S., Wilbrink, J., Craven, A.J. and Nicholson, W.A.P. (2008) Near-simultaneous dual energy range EELS spectrum imaging. Ultramicroscopy, 108(12), pp. 1586-1594. (doi: 10.1016/j.ultramic.2008.05.006)

Docherty, F.T. , MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., McFadzean, S. and McGilvery, C.M. (2008) A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon. Microelectronic Engineering, 85(1), pp. 61-64. (doi: 10.1016/j.mee.2007.03.001)

MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., Docherty, F.T. , McGilvery, C.M. and McFadzean, S. (2007) Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation. Electrochemical and Solid State Letters, 10(6), G33-G35. (doi: 10.1149/1.2718399)

Scott, J. , Docherty, F.T., MacKenzie, M., Smith, W., Miller, B., Collins, C.L. and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26(1), pp. 223-226. (doi: 10.1088/1742-6596/26/1/053)

Thomas, P., Scott, J. , MacKenzie, M., McFadzean, S., Wilbrink, J. and Craven, A. (2006) Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch. Microscopy and Microanalysis, 12(S02), pp. 1362-1363. (doi: 10.1017/S1431927606065512)

MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2006) Interfacial reactions in a HfO2/TiN/poly-Si gate stack. Applied Physics Letters, 88, (doi: 10.1063/1.2201891)

MacKenzie, M., Craven, A.J., Mccomb, D.W., Hamilton, D.A. and McFadzean, S. (2004) Spectrum imaging of high-k dielectric stacks. In: Institute of Physics Electron Microscopy and Analysis Group Conference, Oxford, UK, 3 -5 Sep 2003, pp. 299-302.

McComb, D.W., Craven, A.J., Hamilton, D.A. and MacKenzie, M. (2004) Probing local coordination environments in high-k materials for gate stack applications. Applied Physics Letters, 84(22), pp. 4523-4525. (doi: 10.1063/1.1758303)

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