Li, J. et al. (2016) Nano-optical single-photon response mapping of waveguide integrated molybdenum silicide (MoSi) superconducting nanowires. Optics Express, 24(13), pp. 13931-13938. (doi: 10.1364/OE.24.013931) (PMID:27410555)
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120211.pdf - Published Version Available under License Creative Commons Attribution. 4MB |
Abstract
We present low temperature nano-optical characterization of a silicon-on-insulator (SOI) waveguide integrated SNSPD. The SNSPD is fabricated from an amorphous Mo83Si17 thin film chosen to give excellent substrate conformity. At 350 mK, the SNSPD exhibits a uniform photoresponse under perpendicular illumination, corresponding to a maximum system detection efficiency of approximately 5% at 1550 nm wavelength. Under these conditions 10 Hz dark count rate and 51 ps full width at half maximum (FWHM) timing jitter is observed.
| Item Type: | Articles |
|---|---|
| Keywords: | (230.5160) Photodetectors; (220.0220) Optical design and fabrication; (230.3120) Integrated optics devices; (270.5570) Quantum detectors. |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Li, Dr Jian and Sorel, Professor Marc and Banerjee, Mr Archan and Hadfield, Professor Robert and Baker, Luke James and Erotokritou, Mr Kleanthis and Natarajan, Dr Chandra and Heath, Mr Robert |
| Authors: | Li, J., Kirkwood, R. A., Baker, L. J., Bosworth, D. A., Erotokritou, K., Banerjee, A., Heath, R. M., Natarajan, C. M., Barber, Z. H., Sorel, M., and Hadfield, R. H. |
| Subjects: | Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Research Group: | Quantum Sensors |
| Journal Name: | Optics Express |
| Publisher: | Optical Society of America |
| ISSN: | 1094-4087 |
| ISSN (Online): | 1094-4087 |
| Published Online: | 14 June 2016 |
| Copyright Holders: | Copyright © 2016 Optical Society of America |
| First Published: | First published in Optics Express 24(13):1391-13938 |
| Publisher Policy: | Reproduced under a Creative Commons License |
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