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Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability

Wang, X., Cheng, B., Millar, C., Reid, D. and Asenov, A. (2014) Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability. In: 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology (ICSICT 2014), Guilin, China, 28-31 Oct 2014, pp. 702-704.

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Publisher's URL: http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=32164

Abstract

No abstract available.

Item Type:Conference Proceedings
Additional Information:ISBN: 9781479932818
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Millar, Dr Campbell and Reid, Mr David and Cheng, Dr Binjie and Wang, Dr Xingsheng and Asenov, Professor Asen
Authors: Wang, X., Cheng, B., Millar, C., Reid, D., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
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