Optical absorption measurements on crystalline silicon test masses at 1550 nm

Steinlechner, J., Krueger, C., Lastzka, N., Steinlechner, S., Khalaidovski, A. and Schnabel, R. (2013) Optical absorption measurements on crystalline silicon test masses at 1550 nm. Classical and Quantum Gravity, 30(9), 095007. (doi: 10.1088/0264-9381/30/9/095007)

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Abstract

Crystalline silicon is currently being discussed as test-mass material for future generations of gravitational wave detectors that will operate at cryogenic temperatures. We present optical absorption measurements on a large dimension sample of crystalline silicon at a wavelength of 1550 nm at room temperature. The absorption was measured in a high-intensity monolithic cavity setup using the photo-thermal self-phase modulation technique. The result for the absorption coefficient of this sample with a specific resistivity of 11 kOhmcm was measured to be α = (264 ± 39) ppm/cm for an intensity of 700 W/cm.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Steinlechner, Dr Jessica and Steinlechner, Dr Sebastian
Authors: Steinlechner, J., Krueger, C., Lastzka, N., Steinlechner, S., Khalaidovski, A., and Schnabel, R.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Classical and Quantum Gravity
Publisher:Institute of Physics
ISSN:0264-9381
ISSN (Online):1361-6382

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