Radwell, N., Mitchell, K. J., Gibson, G. M. , Edgar, M. P., Bowman, R. and Padgett, M. J. (2014) Single-pixel infrared and visible microscope. Optica, 1(5), pp. 285-289. (doi: 10.1364/OPTICA.1.000285)
|
Text
98885.pdf - Published Version 1MB |
Abstract
Microscopy is an essential tool in a huge range of research areas. Until now, microscopy has been largely restricted to imaging in the visible region of the electromagnetic spectrum. Here we present a microscope system that uses single-pixel imaging techniques to produce images simultaneously in the visible and shortwave infrared. We apply our microscope to the inspection of various objects, including a silicon CMOS sensor, highlighting the complementarity of the visible and shortwave infrared wavebands. The system is capable of producing images with resolutions between 32×32 and 128×128 pixels at corresponding frame rates between 10 and 0.6 Hz. We introduce a compressive technique that does not require postprocessing, resulting in a predicted frame rate increase by a factor 8 from a compressive ratio of 12.5% with only 28% relative error.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Edgar, Dr Matthew and Gibson, Dr Graham and Bowman, Dr Richard and Radwell, Dr Neal and Padgett, Professor Miles |
| Authors: | Radwell, N., Mitchell, K. J., Gibson, G. M., Edgar, M. P., Bowman, R., and Padgett, M. J. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Optica |
| Publisher: | Optical Society of America |
| ISSN: | 2334-2536 |
| Copyright Holders: | Copyright © 2014 Optical Society of America |
| First Published: | First published in Optica 1(5):285-289 |
| Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher. |
University Staff: Request a correction | Enlighten Editors: Update this record
Altmetric
Altmetric