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Atomic force microscope – an effective tool for measuring piezoelectric constants of soft materials

Torre, B., Dahiya, R.S. , Lorenzelli, L. and Cingolani, R. (2011) Atomic force microscope – an effective tool for measuring piezoelectric constants of soft materials. In: Piezo 2011 Conference, Sestriere, Italy, 28 Feb- 02 Mar 2011,

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Publisher's URL: http://www.piezoinstitute.com/piezo2011/

Abstract

No abstract available.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Dahiya, Professor Ravinder
Authors: Torre, B., Dahiya, R.S., Lorenzelli, L., and Cingolani, R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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