On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes

Glover, J., Khalid, A. , Cumming, D.R.S. , Montes Bajo, M., Kuball, M., Stephen, A., Dunn, G.M. and Oxley, C.H. (2014) On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes. Microwave and Optical Technology Letters, 56(11), pp. 2699-2700. (doi:10.1002/mop.28681)

Glover, J., Khalid, A. , Cumming, D.R.S. , Montes Bajo, M., Kuball, M., Stephen, A., Dunn, G.M. and Oxley, C.H. (2014) On wafer thermal characterization of miniature gallium arsenide microcoolers with thermal loading from DC probes. Microwave and Optical Technology Letters, 56(11), pp. 2699-2700. (doi:10.1002/mop.28681)

Full text not currently available from Enlighten.

Abstract

Miniature aluminium gallium arsenide/gallium arsenide (AlGaAs/GaAs) coolers were fabricated on wafer, enabling different contact geometries to be realized in the same process run. To individually DC bias the microcooler, microprobes were used leading to thermal loading of the cooler. A simple experimental technique was developed to verify the temperature difference (ΔT) between the cold cathode and hot anode contacts is due to cooling rather than heating of the cooler.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Cumming, Professor David and Khalid, Dr Ata-ul-Habib
Authors: Glover, J., Khalid, A., Cumming, D.R.S., Montes Bajo, M., Kuball, M., Stephen, A., Dunn, G.M., and Oxley, C.H.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Microwave and Optical Technology Letters
Publisher:John Wiley & Sons, Inc.
ISSN:0895-2477
ISSN (Online):1098-2760

University Staff: Request a correction | Enlighten Editors: Update this record