Cipiccia, S. et al. (2013) Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays. Review of Scientific Instruments, 84(11), p. 113302. (doi: 10.1063/1.4825374) (PMID:24289391)
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Publisher's URL: http://dx.doi.org/10.1063/1.4825374
Abstract
Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | O'Shea, Professor Val and Maneuski, Dr Dima and Hamilton, Dr David and Montgomery, Dr Rachel |
Authors: | Cipiccia, S., Wiggins, S. M., Maneuski, D., Brunetti, E., Vieux, G., Yang, X., Issac, R. C., Welsh, G. H., Anania, M., Islam, M. R., Ersfeld, B., Montgomery, R., Smith, G., Hoek, M., Hamilton, D.J., Lemos, N. R. C., Symes, D. R., Rajeev, P. P., O'Shea, V., Dias, J. M., and Jaroszynski, D. A. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Review of Scientific Instruments |
Publisher: | American Institute of Physics |
ISSN: | 0034-6748 |
ISSN (Online): | 1089-7623 |
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