High-sensitivity in-band OSNR monitoring system integrated on a silicon photonics chip

Morichetti, F., Annoni, A., Sorel, M. and Melloni, A. (2013) High-sensitivity in-band OSNR monitoring system integrated on a silicon photonics chip. IEEE Photonics Technology Letters, 25(19), pp. 1939-1942. (doi: 10.1109/LPT.2013.2279545)

Abstract

We report on a compact ( footprint) silicon photonics integrated system performing high-sensitivity monitoring of in-band optical signal-to-noise ratio (OSNR). The system, including a thermally tunable racetrack resonator filter and an unbalanced Mach-Zehnder interferometer, performs the autocorrelation measurement of a filtered fraction of the noisy signal spectrum. Monitor performance is evaluated on a 10 Gb/s ON/OFF keying nonreturn to zero signal, demonstrating an accuracy of 0.4 dB over a wide OSNR range from 8 to 28 dB. We also demonstrate that the proposed system induces a tiny distortion of the optical signal, making it suitable for in-line monitoring of signal quality.

• Item Type: Articles
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Sorel, Professor Marc
• Authors: Morichetti, F., Annoni, A., Sorel, M., and Melloni, A.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• Journal Name: IEEE Photonics Technology Letters
• Publisher: IEEE
• ISSN: 1041-1135
• ISSN (Online): 1941-0174