High-sensitivity in-band OSNR monitoring system integrated on a silicon photonics chip

Morichetti, F., Annoni, A., Sorel, M. and Melloni, A. (2013) High-sensitivity in-band OSNR monitoring system integrated on a silicon photonics chip. IEEE Photonics Technology Letters, 25(19), pp. 1939-1942. (doi:10.1109/LPT.2013.2279545)

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Publisher's URL: http://dx.doi.org/10.1109/LPT.2013.2279545

Abstract

We report on a compact ( footprint) silicon photonics integrated system performing high-sensitivity monitoring of in-band optical signal-to-noise ratio (OSNR). The system, including a thermally tunable racetrack resonator filter and an unbalanced Mach-Zehnder interferometer, performs the autocorrelation measurement of a filtered fraction of the noisy signal spectrum. Monitor performance is evaluated on a 10 Gb/s ON/OFF keying nonreturn to zero signal, demonstrating an accuracy of 0.4 dB over a wide OSNR range from 8 to 28 dB. We also demonstrate that the proposed system induces a tiny distortion of the optical signal, making it suitable for in-line monitoring of signal quality.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Sorel, Professor Marc
Authors: Morichetti, F., Annoni, A., Sorel, M., and Melloni, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Photonics Technology Letters
Publisher:IEEE
ISSN:1041-1135
ISSN (Online):1941-0174

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