Disorder mapping in VCSELs using frequency-selective feedback

Ackemann, T., Radwell, N., Noblet, Y. and Jäger, R. (2012) Disorder mapping in VCSELs using frequency-selective feedback. Optics Letters, 37(6), pp. 1079-1081. (doi: 10.1364/OL.37.001079)

Full text not currently available from Enlighten.

Publisher's URL: http://dx.doi.org/10.1364/OL.37.001079

Abstract

We report on a simple method with a high spectral and spatial resolution for mapping variations in the cavity resonance of a plano-planar broad-area laser based on frequency-selective feedback. The demonstration experiment uses a vertical-cavity surface-emitting-laser (VCSEL), in which growth induced inhomogeneities are of particular importance. It relies only on a standalone laser with a narrow-bandwidth passive filter avoiding the need for an expensive tunable laser or high-resolution spectrometer.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Radwell, Dr Neal
Authors: Ackemann, T., Radwell, N., Noblet, Y., and Jäger, R.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Optics Letters
Publisher:Optical Society of America
ISSN:0146-9592
ISSN (Online):1539-4794

University Staff: Request a correction | Enlighten Editors: Update this record