X-ray imaging with photon counting hybrid semiconductor pixel detectors

Manolopoulos, S. et al. (1999) X-ray imaging with photon counting hybrid semiconductor pixel detectors. In: 6th International Workshop on GaAs Detectors and Related Compounds, Pruhonice, Czech Republic, 22-26 Jun 1998, pp. 38-43. (doi:10.1016/S0168-9002(99)00430-1)

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Publisher's URL: http://dx.doi.org/10.1016/S0168-9002(99)00430-1


Semiconductor pixel detectors, originally developed for particle physics experiments, have been studied as X-ray imaging devices. The performance of devices using the 3 read-out chip bump-bonded to pixellated silicon semiconductor detectors is characterised in terms of their signal-to-noise ratio when exposed to 60 kVp X-rays. Although parts of the devices achieve values of this ratio compatible with the noise being photon statistics limited, this is not found to hold for the whole pixel matrix, resulting in the global signal-to-noise ratio being compromised. First results are presented of X-ray images taken with a gallium arsenide pixel detector bump-bonded to a new read-out chip, (MEDIPIX), which is a single photon counting read-out chip incorporating a 15-bit counter in every pixel.

Item Type:Conference Proceedings
Glasgow Author(s) Enlighten ID:Bates, Dr Richard and O'Shea, Professor Val and Watt, Dr John and Smith, Professor Kenway
Authors: Manolopoulos, S., Bates, R., Campbell, M., Snoeys, W., Heijne, E., Pernigotti, E., Raine, C., Smith, K., Watt, J., O'Shea, V., Ludwig, J., and Schwarz, C.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

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