SIFT keypoint descriptors for range image analysis

Lo, T.-W.R., and Siebert, J.P. (2007) SIFT keypoint descriptors for range image analysis. In: British Machine Vision Association and Society for Pattern Recognition One Day Symposium: The Inaugural Student Papers Meeting, 2007,

Full text not currently available from Enlighten.

Item Type:Conference Proceedings
Glasgow Author(s) Enlighten ID:Siebert, Dr Paul and Lo, Miss Tsz-Wai
Authors: Lo, T.-W.R.,, and Siebert, J.P.
College/School:College of Science and Engineering > School of Computing Science

University Staff: Request a correction | Enlighten Editors: Update this record