Scanning near-field optical spectroscopy and imaging using nanofabricated probes

Zhou, H., Midha, A., Mills, G., Donaldson, L. and Weaver, J.M.R. (1999) Scanning near-field optical spectroscopy and imaging using nanofabricated probes. Applied Physics Letters, 75(13), pp. 1824-1826. (doi:10.1063/1.124840)

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Abstract

We have designed and constructed a scanning near-field optical microscopy (SNOM) system which is based on batch-fabricated aperture probes fabricated using micromachining and direct-write electron-beam lithography. The aperture is situated at the hollow tip apex of a modified silicon nitride atomic force microscope (AFM) cantilever. The SNOM/AFM probes are used both for excitation and collection of luminescence due to their excellent optical efficiency. The integration of a cantilever with the aperture allows better control of the aperture–sample distance and also results in considerable simplification of the SNOM system. Using this system, we have obtained near-field luminescence spectra and imaging of GaAs/AlGaAs quantum wires and wells, and have demonstrated spectrally resolved luminescence imaging with a spatial resolution of ∼50 nm.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Zhou, Dr Haiping and Weaver, Professor Jonathan
Authors: Zhou, H., Midha, A., Mills, G., Donaldson, L., and Weaver, J.M.R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Physics Letters
ISSN:0003-6951
ISSN (Online):1077-3118

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