Asenov, A. , Cheng, B., Wang, X., Brown, A.R., Reid, D., Millar, C. and Alexander, C. (2013) Simulation based transistor-SRAM co-design in the presence of statistical variability and reliability. In: IEEE International Electron Devices Meeting (IEDM), Washington, D.C., USA, 9-11 Dec 2013, pp. 818-821.
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Alexander, Dr Craig and Millar, Dr Campbell and Reid, Mr David and Brown, Mr Andrew and Cheng, Dr Binjie and Wang, Dr Xingsheng and Asenov, Professor Asen |
| Authors: | Asenov, A., Cheng, B., Wang, X., Brown, A.R., Reid, D., Millar, C., and Alexander, C. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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