High-Q optical nanobeam cavities for label-free sensing

Rahman, M.G.A., Velha, P., De La Rue, R.M. and Johnson, N.P. (2013) High-Q optical nanobeam cavities for label-free sensing. In: Optical Sensors 2013, Prague, Czech Republic, 15-17 Apr 2013, 87740G-87740G. (doi:10.1117/12.2017696)

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Publisher's URL: http://dx.doi.org/10.1117/12.2017696

Abstract

The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.

Item Type:Conference Proceedings
Keywords:silicon photonics, SOI, nanobeam microcavity, optical sensor
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Velha, Mr Philippe and Johnson, Dr Nigel and De La Rue, Professor Richard
Authors: Rahman, M.G.A., Velha, P., De La Rue, R.M., and Johnson, N.P.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISSN:0277786X

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