Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A. and Dunin-Borkowski, R.E. (2013) Characterization of Fe-N nanocrystals and nitrogen–containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy. Journal of Applied Physics, 114(3), 033530. (doi: 10.1063/1.4816049)
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84436(i).pdf - Accepted Version 1MB |
Abstract
Nanometric inclusions filled with nitrogen, located adjacent to FenN (n¼3 or 4) nanocrystals within (Ga,Fe)N layers, are identified and characterized using scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS). High-resolution STEM images reveal a truncation of the Fe-N nanocrystals at their boundaries with the nitrogen-containing inclusions. A controlled electron beam hole drilling experiment is used to release nitrogen gas from an inclusion in situ in the electron microscope. The density of nitrogen in an individual inclusion is measured to be 1.460.3 g/cm3. These observations provide an explanation for the location of surplus nitrogen in the (Ga,Fe)N layers, which is liberated by the nucleation of FenN (n>1) nanocrystals during growth.
| Item Type: | Articles (Other) |
|---|---|
| Additional Information: | Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 114(3):033530 and may be found at http://dx.doi.org/10.1063/1.4816049. |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Schaffer, Dr Bernhard and Craven, Professor Alan |
| Authors: | Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A., and Dunin-Borkowski, R.E. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Applied Physics |
| Publisher: | American Institute of Physics |
| ISSN: | 0021-8979 |
| ISSN (Online): | 1089-7550 |
| Copyright Holders: | Copyright © 2013 AIP Publishing LLC |
| First Published: | First published in Journal of Applied Physics 114(3):033530 |
| Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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