Characterization of Fe-N nanocrystals and nitrogen–containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy

Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A. and Dunin-Borkowski, R.E. (2013) Characterization of Fe-N nanocrystals and nitrogen–containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy. Journal of Applied Physics, 114(3), 033530. (doi:10.1063/1.4816049)

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Abstract

Nanometric inclusions filled with nitrogen, located adjacent to FenN (n¼3 or 4) nanocrystals within (Ga,Fe)N layers, are identified and characterized using scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS). High-resolution STEM images reveal a truncation of the Fe-N nanocrystals at their boundaries with the nitrogen-containing inclusions. A controlled electron beam hole drilling experiment is used to release nitrogen gas from an inclusion in situ in the electron microscope. The density of nitrogen in an individual inclusion is measured to be 1.460.3 g/cm3. These observations provide an explanation for the location of surplus nitrogen in the (Ga,Fe)N layers, which is liberated by the nucleation of FenN (n>1) nanocrystals during growth.

Item Type:Articles (Other)
Additional Information:Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 114(3):033530 and may be found at http://dx.doi.org/10.1063/1.4816049.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Schaffer, Dr Bernhard and Craven, Professor Alan
Authors: Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A., and Dunin-Borkowski, R.E.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
Publisher:American Institute of Physics
ISSN:0021-8979
ISSN (Online):1089-7550
Copyright Holders:Copyright © 2013 AIP Publishing LLC
First Published:First published in Journal of Applied Physics 114(3):033530
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
413371SuperSTEM - the UK aberration corrected STEM facilityAlan CravenEngineering & Physical Sciences Research Council (EPSRC)EP/D040205/1P&A - PHYSICS & ASTRONOMY